Title :
Transverse resonance method for analysing T-septum waveguides
Author :
Shen, Z.X. ; Lou, X.M. ; Li, S.F.
Author_Institution :
Res. Inst. of Microwave Tech., Southeast Univ., Jiangsu, China
Abstract :
A transverse resonance method for analysing rectangular T-septum waveguides is described. This method is based on a simple equivalent circuit model. Numerical results for cutoff wavelength and bandwidth characteristics are compared with available values in the literature.
Keywords :
equivalent circuits; rectangular waveguides; waveguide theory; bandwidth characteristics; cutoff wavelength; equivalent circuit model; numerical results; rectangular T-septum waveguides; transverse resonance method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900052
