DocumentCode
1129419
Title
Finite sample effects in vector autoregressive modeling
Author
De Waele, Stijn ; Broersen, Piet M T
Author_Institution
Dept. of Appl. Phys., Delft Univ. of Technol., Netherlands
Volume
51
Issue
5
fYear
2002
fDate
10/1/2002 12:00:00 AM
Firstpage
917
Lastpage
922
Abstract
In vector autoregressive modeling, the order selected with the Akaike Information Criterion tends to be too high. This effect is called overfit. Finite sample effects are an important cause of overfit. By incorporating finite sample effects, an order selection criterion for vector AR models can be found with an optimal trade-off of underfit and overfit. The finite sample formulae in this paper provide a more accurate description of the behavior of vector autoregressive estimators than asymptotic theory or the exact Cramer-Rao lower bound. A comparison of estimators in simulations as well as experimental data shows that the Nuttall-Strand estimator is more accurate than the least-squares estimator for high-order models. With the extension to channel prediction, the finite sample theory can also be used in order selection for autoregressive models with exogeneous input (ARX models) in system identification.
Keywords
autoregressive processes; channel estimation; signal sampling; spectral analysis; time series; ARX models; Akaike Information Criterion order selection; Cramer-Rao lower bound; asymptotic theory; autoregressive models with exogeneous input; channel prediction; finite sample effects; finite sample theory; high-order models; least-squares estimator; multivariate processes; optimal underfit/overfit trade-off; overfit effect; simulations; spectral analysis; system identification; time series analysis; vector AR model order selection criterion; vector autoregressive estimators; vector autoregressive modeling; Biological system modeling; Clutter; Econometrics; Estimation theory; Predictive models; Radar applications; Reactive power; Signal analysis; System identification; Time series analysis;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2002.806039
Filename
1174017
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