Title :
Selecting test frequencies for two-tone phase plane analysis of ADCs
Author :
Blair, Jerome J.
Author_Institution :
Betchel Nevada, Las Vegas, NV, USA
fDate :
10/1/2002 12:00:00 AM
Abstract :
We show how to select the frequencies for a two-tone sinewave test of an analog-to-digital converter. The frequencies are selected in a manner to guarantee nearly uniform coverage of a selected ellipse in the phase plane. A proof that the selected frequencies provide the desired coverage is given.
Keywords :
analogue-digital conversion; circuit analysis computing; circuit testing; distortion; error analysis; ADC dynamic errors; ADC testing; ADC two-tone phase plane analysis; analog-to-digital converter two-tone sinewave test; distortion compensation; phase plane error models; selected phase plane ellipse uniform coverage; test frequencies selection; Analog-digital conversion; Character recognition; Circuit testing; Data analysis; Error correction; Frequency conversion; Iron; Phase distortion; Sampling methods;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.807805
