DocumentCode
1129503
Title
Selecting test frequencies for two-tone phase plane analysis of ADCs
Author
Blair, Jerome J.
Author_Institution
Betchel Nevada, Las Vegas, NV, USA
Volume
51
Issue
5
fYear
2002
fDate
10/1/2002 12:00:00 AM
Firstpage
976
Lastpage
979
Abstract
We show how to select the frequencies for a two-tone sinewave test of an analog-to-digital converter. The frequencies are selected in a manner to guarantee nearly uniform coverage of a selected ellipse in the phase plane. A proof that the selected frequencies provide the desired coverage is given.
Keywords
analogue-digital conversion; circuit analysis computing; circuit testing; distortion; error analysis; ADC dynamic errors; ADC testing; ADC two-tone phase plane analysis; analog-to-digital converter two-tone sinewave test; distortion compensation; phase plane error models; selected phase plane ellipse uniform coverage; test frequencies selection; Analog-digital conversion; Character recognition; Circuit testing; Data analysis; Error correction; Frequency conversion; Iron; Phase distortion; Sampling methods;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2002.807805
Filename
1174026
Link To Document