DocumentCode :
1129589
Title :
Incremental diffraction coefficients for planar surfaces
Author :
Shore, Robert A. ; Yaghjian, Arthur D.
Author_Institution :
Rome Air Dev. Center, Hanscom AFB, MA, USA
Volume :
36
Issue :
1
fYear :
1988
fDate :
1/1/1988 12:00:00 AM
Firstpage :
55
Lastpage :
70
Abstract :
Exact expressions for incremental diffraction coefficients at arbitrary angles of incidence and scattering are derived directly in terms of the corresponding two-dimensional, cylindrical diffraction coefficients. The derivation is limited to perfectly conducting scatterers that consist of planar surfaces, such as the wedge, the slit in an infinite plane, the strip, parallel or skewed planes, polygonal cylinders, or any combination thereof; and requires a known expression (whether exact or approximate) for the two-dimensional diffraction coefficients produced by the current on each different plane. Specifically, if one can supply an expression for the conventional diffraction coefficients of a two-dimensional planar scatterer, one can immediately find the incremental diffraction coefficients through direct substitution. No integration, differentiation, or specific knowledge of the current is required. Special attention is given to defining ambiguously all real angles and their analytic continuation into imaginary values required by the incremental diffraction coefficients
Keywords :
electromagnetic wave diffraction; electromagnetic wave scattering; EM wave diffraction; arbitrary angles of incidence; incremental diffraction coefficients; infinite plane; parallel plane; perfectly conducting scatterers; planar surfaces; polygonal cylinders; scattering; skewed planes; strip plane; two-dimensional planar scatterer; wedge; Electromagnetic diffraction; Electromagnetic scattering; Genetic expression; Image analysis; Optical diffraction; Optical scattering; Optical surface waves; Physical optics; Physical theory of diffraction; Strips;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.1075
Filename :
1075
Link To Document :
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