DocumentCode :
1129634
Title :
Resolution in model-based measurement
Author :
Van den Bos, Adriaan
Author_Institution :
Dept. of Phys., Delft Univ. of Technol., Netherlands
Volume :
51
Issue :
5
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
1055
Lastpage :
1060
Abstract :
In measurement practice, the concept resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh´s well-known two-point resolution, stems from optics. It is based on the presumed limits of the human visual system to distinguish the images of two closely located point sources in observations of the sum of the images. Modern definitions of resolution, on the other hand, are based on parametric statistical models of the observations. They implicitly assume the use of parameter estimation methods and show that the ultimate limits to resolution are nonsystematic (statistical) and systematic (modeling) errors.
Keywords :
measurement errors; measurement theory; parameter estimation; probability; statistical analysis; model-based measurement; modeling errors; parameter estimation; parametric statistical models; resolution; statistical errors; Humans; Image resolution; Instruments; Nonlinear optics; Optical noise; Parameter estimation; Probability; Signal resolution; Signal to noise ratio; Visual system;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2002.806031
Filename :
1174041
Link To Document :
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