• DocumentCode
    1129634
  • Title

    Resolution in model-based measurement

  • Author

    Van den Bos, Adriaan

  • Author_Institution
    Dept. of Phys., Delft Univ. of Technol., Netherlands
  • Volume
    51
  • Issue
    5
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1055
  • Lastpage
    1060
  • Abstract
    In measurement practice, the concept resolution is usually associated with the ability to distinguish two overlapping components of the same kind in observations. The original concept, Rayleigh´s well-known two-point resolution, stems from optics. It is based on the presumed limits of the human visual system to distinguish the images of two closely located point sources in observations of the sum of the images. Modern definitions of resolution, on the other hand, are based on parametric statistical models of the observations. They implicitly assume the use of parameter estimation methods and show that the ultimate limits to resolution are nonsystematic (statistical) and systematic (modeling) errors.
  • Keywords
    measurement errors; measurement theory; parameter estimation; probability; statistical analysis; model-based measurement; modeling errors; parameter estimation; parametric statistical models; resolution; statistical errors; Humans; Image resolution; Instruments; Nonlinear optics; Optical noise; Parameter estimation; Probability; Signal resolution; Signal to noise ratio; Visual system;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.806031
  • Filename
    1174041