• DocumentCode
    1129688
  • Title

    Polarization of the fluorescent light of Ne atoms interacting with a laser beam measurement of several relaxation times

  • Author

    Decomps, Bernard ; Dumont, Michel

  • Author_Institution
    Faculté des Sciences, Laboratories de Spectroscopie Hertzienne de ĺE.N.S., Paris, France
  • Volume
    4
  • Issue
    11
  • fYear
    1968
  • fDate
    11/1/1968 12:00:00 AM
  • Firstpage
    916
  • Lastpage
    922
  • Abstract
    The fluorescent light from two atomic levels is studied assuming that the atoms are subjected to a gas discharge, to a static magnetic field, and, simultaneously, to a laser beam having the transition frequency between the atomic levels. Calculations are developed in the formalism of irreducible tensor operators. One takes into account the existence of isotropic relaxations and cascade effects due to spontaneous emission between the upper and the lower levels. Following Lamb, the laser beam is described classically by its electric field, and its effects are calculated by perturbation theory. It is predicted that the σ component of fluorescent light exhibits the Hanle effect, which allows one to measure the relaxation rates \\Gamma (0) and \\Gamma (2) of the population and of the alignment of the emitting level, respectively. Experimental agreement with the theoretical analysis has been found for the 3s_{2}, 2s_{2} , and 2P_{4} levels of Ne. Among the experimental results obtained by this method are the natural widths and the collision cross sections for population (quenching collision) and for alignment. Several transition probabilities are also derived. Furthermore, the theory of coherent imprisonment of the fluorescent line has been found valid even if laser pumping light is used.
  • Keywords
    Atom lasers; Atomic beams; Atomic measurements; Fluorescence; Gas lasers; Laser beams; Laser transitions; Magnetic field measurement; Optical polarization; Quantum cascade lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1968.1075010
  • Filename
    1075010