• DocumentCode
    1129763
  • Title

    Double resonance in gaseous lasers

  • Author

    Culshaw, William

  • Author_Institution
    Palo Alto Research Laboratory, Palo Alto, Lockheed Missiles and space company, CA, USA
  • Volume
    4
  • Issue
    12
  • fYear
    1968
  • fDate
    12/1/1968 12:00:00 AM
  • Firstpage
    979
  • Lastpage
    987
  • Abstract
    The simultaneous action of a RF perturbation between the Zeeman sublevels of an atomic transition, which is also sustaining laser oscillations, is given further consideration. General equations are derived that describe the phenomena in a rotating effective magnetic field basis. These are valid for any level of the RF perturbation, being then solved by iteration to third order in the laser electric field and integrated exactly over the atomic velocity distribution. Results are given for single-π-mode laser operation on a J = 1 \\rightarrow 0 transition and for single-mode operation on each of the well-resolved σ components of the Zeeman splitting. The extension to more complex transitions, such as a J = 1 \\rightarrow 2 , is then given. A dominant resonance peak in the laser intensity occurs when the RF equals the Zeeman splitting of either the upper or lower states of the transition. Population differences amongst the upper sublevels are more effective than those between the lower sublevels and give the smallest resonance widths. For operation on the σ modes, the main effect is a reduction in the saturation coefficient β, together with smaller changes in the coupling coefficients θ between the oscillations. Such changes will affect the general behavior near the singular points of the nonlinear equations, and will change the shape of the curves of mode intensities as functions of cavity detuning and magnetic field.
  • Keywords
    Atom lasers; Atomic beams; Gas lasers; Laser modes; Laser transitions; Magnetic fields; Magnetic resonance; Nonlinear equations; Radio frequency; Shape;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1968.1075019
  • Filename
    1075019