DocumentCode
1129950
Title
Comparison of two sets of low-order basis functions for tetrahedral VIE modeling
Author
Kulkarni, S. ; Lemdiasov, R. ; Ludwig, R. ; Makarov, S.
Author_Institution
ECE Dept., Worcester Polytech. Inst., MA, USA
Volume
52
Issue
10
fYear
2004
Firstpage
2789
Lastpage
2795
Abstract
A convergence study is made for the two types of low-order basis functions for the volume integral equation (VIE). Both functions impose the continuity of the normal component of the electric flux through the faces. The one basis function is that of Schaubert, Wilton, and Glisson (1984) and is face-based. Another basis function was first introduced by de Carvalho and de Souza Mendes (1999) and is edge-based. The exact number of unknowns for the edge-based functions is determined in this study. The study demonstrates a better performance of the edge-based basis functions compared to the face-based bases. First, the edge-based basis functions have nearly the same or a faster convergence rate for equal tetrahedral meshes. They also show a high numerical stability. Second, for the same tetrahedral mesh, the number of unknowns for the edge-based functions is considerably smaller. The ratio of unknowns (edge-based versus face-based) ranges from 0.6 for rough plate meshes to approximately 0.5 for large volumetric meshes. Third, the edge-based functions are piecewise constant and are easily implemented into the method of moments. Their disadvantage is a preliminary condition "operation," which implies the elimination of the space of the basis set.
Keywords
electromagnetic wave scattering; integral equations; mesh generation; method of moments; numerical stability; convergence; edge-based basis functions; edge-based functions; electric flux; equal tetrahedral meshes; low-order basis functions; method of moments; rough plate meshes; scattering; tetrahedral VIE modeling; volume integral equation; Computational complexity; Convergence; Dielectric materials; Integral equations; Moment methods; Numerical stability; Permittivity; Resonance; Robustness; Scattering; Edge basis functions; MoM; method of moments; scattering; volume integral equation;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.2004.834377
Filename
1341641
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