• DocumentCode
    1129950
  • Title

    Comparison of two sets of low-order basis functions for tetrahedral VIE modeling

  • Author

    Kulkarni, S. ; Lemdiasov, R. ; Ludwig, R. ; Makarov, S.

  • Author_Institution
    ECE Dept., Worcester Polytech. Inst., MA, USA
  • Volume
    52
  • Issue
    10
  • fYear
    2004
  • Firstpage
    2789
  • Lastpage
    2795
  • Abstract
    A convergence study is made for the two types of low-order basis functions for the volume integral equation (VIE). Both functions impose the continuity of the normal component of the electric flux through the faces. The one basis function is that of Schaubert, Wilton, and Glisson (1984) and is face-based. Another basis function was first introduced by de Carvalho and de Souza Mendes (1999) and is edge-based. The exact number of unknowns for the edge-based functions is determined in this study. The study demonstrates a better performance of the edge-based basis functions compared to the face-based bases. First, the edge-based basis functions have nearly the same or a faster convergence rate for equal tetrahedral meshes. They also show a high numerical stability. Second, for the same tetrahedral mesh, the number of unknowns for the edge-based functions is considerably smaller. The ratio of unknowns (edge-based versus face-based) ranges from 0.6 for rough plate meshes to approximately 0.5 for large volumetric meshes. Third, the edge-based functions are piecewise constant and are easily implemented into the method of moments. Their disadvantage is a preliminary condition "operation," which implies the elimination of the space of the basis set.
  • Keywords
    electromagnetic wave scattering; integral equations; mesh generation; method of moments; numerical stability; convergence; edge-based basis functions; edge-based functions; electric flux; equal tetrahedral meshes; low-order basis functions; method of moments; rough plate meshes; scattering; tetrahedral VIE modeling; volume integral equation; Computational complexity; Convergence; Dielectric materials; Integral equations; Moment methods; Numerical stability; Permittivity; Resonance; Robustness; Scattering; Edge basis functions; MoM; method of moments; scattering; volume integral equation;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2004.834377
  • Filename
    1341641