DocumentCode :
1130072
Title :
Phase noise simulation and estimation methods: a comparative study
Author :
Ou, Yuxian ; Barton, Nathen ; Fetche, Radu ; Seshan, Nilakantan ; Fiez, Terri ; Moon, Un-Ku ; Mayaram, Kartikeya
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Volume :
49
Issue :
9
fYear :
2002
fDate :
9/1/2002 12:00:00 AM
Firstpage :
635
Lastpage :
638
Abstract :
A comparison of various simulation and estimation methods available to predict the phase noise in oscillators is presented in this paper. The phase noise of two ring oscillators and one radio frequency CMOS oscillator was determined using the Hajimiri and Lee (1998) phase noise analysis method, and the commercial simulators SpectreRF and EldoRF. Good agreement was obtained between the estimated and simulated phase noise performances. These oscillators were fabricated in a 0.35-μm CMOS process. The measured data also shows reasonable agreement with the analysis and simulations.
Keywords :
CMOS analogue integrated circuits; circuit noise; circuit simulation; estimation theory; integrated circuit noise; oscillators; phase noise; radiofrequency oscillators; 0.35 micron; EldoRE; RF CMOS oscillator; SpectreRF; cross-coupled LC oscillator; oscillator noise; phase noise analysis; phase noise estimation; phase noise simulation; radio frequency oscillator; ring oscillators; Analytical models; CMOS process; Circuits; Moon; Noise measurement; Phase estimation; Phase noise; Predictive models; Radio frequency; Ring oscillators;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7130
Type :
jour
DOI :
10.1109/TCSII.2002.806739
Filename :
1174086
Link To Document :
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