• DocumentCode
    1130134
  • Title

    Effect of band shapes on carrier distribution at high temperature

  • Author

    Hayashi, I.

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
  • Volume
    4
  • Issue
    4
  • fYear
    1968
  • fDate
    4/1/1968 12:00:00 AM
  • Firstpage
    113
  • Lastpage
    118
  • Abstract
    This paper indicates both experimentally and graphically how the distribution of carriers changes above a critical temperature Tc, which is related to the density of states ρ in the band tails. Thus, kT_{c} = E_{0} , where \\rho = \\rho_{0} \\exp (\\Delta E/E_{0} ). The emission spectrum shifts with changing excitation (band filling) at lower temperatures ( T < T_{c} ) and stays at a constant value independent of excitation at higher temperatures ( T > T_{c} ). Experimental results of photoluminescence studies with GaAs crystals show that the quantity E0, obtained from the dependence of the peak energy upon the degree of excitation is the same as the quantity kT\´_{c} , obtained from the dependence of the peak energy upon temperature. This is in agreements with the analysis. For lasing diodes, the threshold will increase steeply with increasing temperature above Tc, if the excited carriers are located mostly in the exponential states of the band tail. E_{0} = (10 \\sim 20) meV and Tc= ( 120 \\sim 250\\deg K) are typical for crystals of heavily compensated GaAs.
  • Keywords
    Crystals; Diodes; Filling; Gallium arsenide; Photoluminescence; Probability distribution; Shape; Tail; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1968.1075061
  • Filename
    1075061