DocumentCode :
1130142
Title :
Temperature dependence of emission efficiency and lasing threshold in laser diodes
Author :
Pankove, Jacques I.
Author_Institution :
RCA Laboratories, Princeton, NJ, USA
Volume :
4
Issue :
4
fYear :
1968
fDate :
4/1/1968 12:00:00 AM
Firstpage :
119
Lastpage :
122
Abstract :
It is found that in GaAs1-xPxinjection lasers both the spontaneous emission efficiency η and the laser threshold j vary exponentially with the temperature T: eta = eta_{0} \\exp(-T/\\theta_{1}) and j = j_{0} \\exp(T/\\theta_{2}) . θ1and θ2are usually nearly equal and range between 50 and 110°K. The behavior of the external efficiency is correlated with the temperature dependence of the absorption along the propagation path of the radiation: as the temperature increases, the exponential absorption edge shifts to lower energies faster than the emission peak. The difference between the two shifts is nearly linear with temperature. The effect of self-absorption on external efficiency was tested by measuring the light emitted transversely to the p-n junction through a layer of constant thickness. With such a geometry, it is shown that the efficiency should vary as \\exp [-A \\exp (T/\\theta)] . The experiment agrees with this prediction.
Keywords :
Absorption; Automatic testing; Diode lasers; Gallium arsenide; Optical propagation; P-n junctions; Spontaneous emission; Temperature dependence; Thickness measurement; Time of arrival estimation;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1968.1075062
Filename :
1075062
Link To Document :
بازگشت