DocumentCode
1130211
Title
Transient temperature distribution in diode lasers and the time duration of the output pulse at 300°K
Author
Broom, R.F.
Author_Institution
University of Berne, Berne, Switzerland
Volume
4
Issue
4
fYear
1968
fDate
4/1/1968 12:00:00 AM
Firstpage
135
Lastpage
140
Abstract
A relatively simple method for obtaining the approximate temperature profile across a GaAs diode laser during a short, rectangular current pulse is described. The method, based on consideration of the thermal diffusion of an initially heated slab parallel to the
junction, allows the inclusion of the thickness and distribution of more than one heat source. Results are valid for short times up to a maximum corresponding to a thermal diffusion length
, where
is the thermal diffusivity, equal to the junction depth. Numerical results are given for GaAs diodes operated at room temperature and some of the assumptions are verified experimentally. Finally, the results are used to estimate the shape and duration of the light output pulse in terms of threshold and drive current.
junction, allows the inclusion of the thickness and distribution of more than one heat source. Results are valid for short times up to a maximum corresponding to a thermal diffusion length
, where
is the thermal diffusivity, equal to the junction depth. Numerical results are given for GaAs diodes operated at room temperature and some of the assumptions are verified experimentally. Finally, the results are used to estimate the shape and duration of the light output pulse in terms of threshold and drive current.Keywords
Absorption; Diode lasers; Gallium arsenide; Heating; Optical pulse generation; Optical pulses; Pulse shaping methods; Shape; Temperature distribution; Thermal conductivity;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1968.1075070
Filename
1075070
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