• DocumentCode
    1130711
  • Title

    Three-Dimensional System-in-Package Using Stacked Silicon Platform Technology

  • Author

    Kripesh, Vaidyanathan ; Yoon, Seung Wook ; Ganesh, V.P. ; Khan, Navas ; Rotaru, Mihai D. ; Fang, Wang ; Iyer, Mahadevan K.

  • Author_Institution
    Inst. of Microelectron., Singapore
  • Volume
    28
  • Issue
    3
  • fYear
    2005
  • Firstpage
    377
  • Lastpage
    386
  • Abstract
    In this paper, a novel method of fabricating three–dimensional (3-D) system-in-package (SiP) using a silicon carrier that can integrate known good dice with an integrated cooling solution is presented. The backbone of this stacked module is the fabrication of a silicon carrier with through-hole conductive interconnects. The design, process, and assembly to fabricate silicon through-hole interconnect using a wet silicon etching method is discussed in this paper. The process optimization to fabricate silicon carriers with solder through-hole interconnect within the design tolerance has been achieved. The design and modeling methodology to optimize the package in terms of electrical aspects of the stacked module is carried out to achieve less interconnect parasitics. An integrated cooling solution for 3-D stacked modules using single-phase and two-phase cooling solutions is also demonstrated for high-power applications. Known good thin flip-chip devices with daisy chain are fabricated and attached to the silicon carrier by flip-chip processes making it a known good carrier after electrical testing. Individual known good carriers are vertically integrated to form 3-D SiP.
  • Keywords
    assembling; chip scale packaging; cooling; etching; flip-chip devices; integrated circuit interconnections; silicon; 3D SiP; 3D stacked modules; 3D system-in-package; flip-chip process; integrated cooling solution; process optimization; silicon carrier; silicon through-hole interconnect; single-phase cooling solutions; solder through-hole interconnect; stacked module; stacked silicon platform technology; thin flip-chip devices; through wafer interconnection; through-hole conductive interconnects; two-phase cooling solutions; wafer thinning; wet silicon etching; Assembly; Cooling; Design methodology; Design optimization; Fabrication; Packaging; Process design; Silicon; Spine; Wet etching; Three-dimensional system-in-package (3-D SiP); integrated cooling solution; stacked modules; through wafer interconnection; wafer thinning;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.852895
  • Filename
    1492506