• DocumentCode
    1130818
  • Title

    Dynamic Analysis of Flip-Chip Self-Alignment

  • Author

    Lu, Hua ; Bailey, Christopher

  • Author_Institution
    Sch. of Comput. & Math. Sci., Univ. of Greenwich, London, UK
  • Volume
    28
  • Issue
    3
  • fYear
    2005
  • Firstpage
    475
  • Lastpage
    480
  • Abstract
    Self-alignment of soldered electronic components such as flip-chips (FC), ball grid arrays (BGA) and optoelectronic devices during solder reflow is important as it ensures good alignment between components and substrates. Two uncoupled analytical models are presented which provide estimates of the dynamic time scales of both the chip and the solder in the self-alignment process. These predicted time scales can be used to decide whether a coupled dynamic analysis is required for the analysis of the chip motion. In this paper, we will show that for flip-chips, the alignment dynamics can be described accurately only when the chip motion is coupled with the solder motion because the two have similar time-scale values. To study this coupled phenomenon, a dynamic modeling method has been developed. The modeling results show that the uncoupled and coupled calculations result in significantly different predictions. The calculations based on the coupled model predict much faster rates of alignment than those predicted using the uncoupled approach.
  • Keywords
    flip-chip devices; reflow soldering; solders; ball grid arrays; chip motion; computer modelling; coupled dynamic analysis; dynamic modeling method; dynamic time scales; flip-chip self-alignment; optoelectronic devices; solder motion; solder reflow; soldered electronic components; uncoupled analytical models; Analytical models; Associate members; Coupled mode analysis; Electronic components; Electronics packaging; Motion analysis; Optoelectronic devices; Predictive models; Soldering; Spline; Computer modeling; coupled dynamic analysis; flip-chip; self-alignment;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2005.848371
  • Filename
    1492516