Title :
Optimal AR-coating for optical waveguide devices
Author :
Hellmich, W. ; Deimel, Peter P.
Author_Institution :
Messerschmitt-Bolkow-Blohm, Munchen, Germany
fDate :
4/1/1992 12:00:00 AM
Abstract :
The authors have calculated the optimal index of refraction and thickness of an antireflection coating layer for optical modes (TE/TM) in semiconductor laser devices. They have taken into account various correction factors concerning the two-dimensional carrier gas, i.e. the change in photonic energy depending on the width of the quantum well, the resulting change in refractive indexes, and the change in effective masses of the carriers. The value √neff*-n eff* is the effective optical mode index. It is compared to the exact calculated value for the optimal coating index
Keywords :
antireflection coatings; laser modes; optical films; optical waveguides; refractive index; semiconductor junction lasers; 2D carrier gas; AR-coating; SQW width; antireflection coating layer; carrier mass; carrier mobility; correction factors; diode laser coatings; effective masses; effective optical mode index; layer thickness optimisation; optical modes; optical waveguide devices; optimal coating index; optimal index of refraction; photonic energy; quantum well; refractive indexes; semiconductor laser devices; Coatings; Gas lasers; Laser modes; Optical devices; Optical refraction; Optical variables control; Optical waveguides; Quantum well lasers; Semiconductor waveguides; Tellurium;
Journal_Title :
Lightwave Technology, Journal of
