DocumentCode :
1131289
Title :
High-Voltage LDMOS With Charge-Balanced Surface Low On-Resistance Path Layer
Author :
Zhang, Bo ; Wang, Wenlian ; Chen, Wanjun ; Li, Zehong ; Li, Zhaoji
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume :
30
Issue :
8
fYear :
2009
Firstpage :
849
Lastpage :
851
Abstract :
A high-voltage lateral double-diffusion MOSFET (LDMOS) with a charge-balanced surface low on-resistance path (CBSLOP) layer is proposed and experimentally demonstrated using a modified CMOS process. The CBSLOP layer can not only provide a low on-resistance path in the on-state but also keep the charge balance between the N and P pillars of a surface low on-resistance path in the off-state, which results in improved breakdown voltage (BV). The experimental results show that the CBSLOP-LDMOS with a drift length of 35 mum exhibits a BV of 500 V and specific on-resistance (R on, sp) of 96 mOmega ldr cm2, yielding to a power figure of merit (BV 2/ R on, sp) of 2.6 MW/cm2 . The excellent device performances, coupled with a CMOS-compatible fabrication process, make the proposed CBSLOP-LDMOS a promising candidate for smart power integrated circuit.
Keywords :
CMOS integrated circuits; electric breakdown; electric resistance; power MOSFET; power integrated circuits; CBSLOP layer; CMOS process; breakdown voltage; charge-balanced surface low on-resistance path layer; compatible fabrication process; high-voltage LDMOS; high-voltage lateral double-diffusion MOSFET; resistance 96 mohm; smart power integrated circuit; voltage 500 V; Charge-balanced surface low on-resistance path (CBSLOP); lateral double-diffusion MOSFET (LDMOS); substrate-assisted depletion effect; superjunction (SJ);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2009.2023541
Filename :
5161329
Link To Document :
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