DocumentCode
1131949
Title
Ultralow Current Measurements With Silicon-on-Sapphire Integrator Circuits
Author
Culurciello, Eugenio ; Montanaro, Hazael ; Kim, Dongsoo
Author_Institution
Dept. of Electr. Eng., Yale Univerity, New Haven, CT
Volume
30
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
258
Lastpage
260
Abstract
This letter reports the results on measurements and modeling of the ultralow current measurement capability of a silicon-on-sapphire current integrator circuit. We have tested the lowest possible current measurable with the device and the noise performance with picoampere input currents. The device is capable of resolving subpicoampere currents with an rms noise of 350 fA in a 110-Hz bandwidth. The device is also capable of digitally measuring currents up to 100 muA by employing a pulse-based A/D converters.
Keywords
analogue-digital conversion; biomedical equipment; biosensors; circuit noise; electric current measurement; integrating circuits; biomedical equipment; noise performance; pulse-based A/D converter; silicon-on-sapphire integrator circuits; ultralow current measurement; Biomedical equipment; biomedical measurements; circuit noise;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2008.2010564
Filename
4768689
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