DocumentCode :
1132138
Title :
Profiling the Rough Surface by Migration
Author :
Feng, Xuan ; Sato, Motoyuki ; Liu, Cai ; Zhang, Yan
Author_Institution :
Coll. of Geo-Exploration Sci. & Technol., Jilin Univ., Changchun
Volume :
6
Issue :
2
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
258
Lastpage :
262
Abstract :
It is often advantageous to estimate the ground surface topography from radar returns. However, the popular method, searching for the brightest pixel in the ground-penetrating radar profile, cannot achieve accurate surface topography in the sharp variable surface case because of the effects of diffraction waves. In this letter, we propose a method to solve the problem and improve the accuracy of surface topography. A migration technique is introduced to refocus the diffraction waves before searching for the brightest pixel. Experimental data have been used to display the effects of diffraction waves and test the method. The result shows that the method can dramatically estimate accurate surface topography even in the sharp variable surface area.
Keywords :
geophysical signal processing; geophysical techniques; ground penetrating radar; remote sensing by radar; rough surfaces; topography (Earth); GPR; diffraction wave; ground penetrating radar; ground surface topography; migration technique; rough surface; Ground-penetrating radar (GPR); migration; rough surfaces; topography;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2008.2011922
Filename :
4768707
Link To Document :
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