Title :
Ten: A concurrent test engineering environment
Author :
Trischler, Erwin ; Johansson, Mats
Keywords :
Automatic testing; Circuit faults; Circuit testing; Costs; Logic arrays; Logic circuits; Logic design; Logic testing; Product development; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1994.303843
