DocumentCode
1132880
Title
Recursion and Testing of Combinational Circuits
Author
Turcat, Claudine ; Verdillon, Andre
Author_Institution
ENSIMAG, University of Grenoble
Issue
6
fYear
1976
fDate
6/1/1976 12:00:00 AM
Firstpage
652
Lastpage
654
Abstract
This correspondence shows how recursion can be used to simplify testing of combinational circuits. Necessary and sufficient conditions for testing simple iterative arrays (one-dimensional) with a fixed number of tests (independent of the number of cells) are given. Multiple faults and diagnosis in such circuits are also studied. The extension of the concept of simple iteration to complex iteration that may realize more complex recursive functions, is defined. Examples of such complex iterative circuits are studied.
Keywords
Fault detection, fault diagnosis, iterative array, recursive function.; Arithmetic; Circuit faults; Circuit testing; Combinational circuits; Digital systems; Electrical fault detection; Fault detection; Fault diagnosis; Laboratories; Sufficient conditions; Fault detection, fault diagnosis, iterative array, recursive function.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1976.1674667
Filename
1674667
Link To Document