• DocumentCode
    1132891
  • Title

    The Error Latency of a Fault in a Sequential Digital Circuit

  • Author

    Shedletsky, John J. ; McCluskey, Edward J.

  • Author_Institution
    Digital Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
  • Issue
    6
  • fYear
    1976
  • fDate
    6/1/1976 12:00:00 AM
  • Firstpage
    655
  • Lastpage
    659
  • Abstract
    In digital circuits there is typically a delay between the occurrence of a fault and the first error in the output. This delay is the error latency of the fault. A model to characterize the error latency of a fault in a sequential circuit is presented.
  • Keywords
    Error latency, input probability, latency interval, Markov chain, random testing, sequential circuits.; Circuit faults; Circuit testing; Clocks; Delay; Digital circuits; Error analysis; Pulse circuits; Random processes; Sequential analysis; Sequential circuits; Error latency, input probability, latency interval, Markov chain, random testing, sequential circuits.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1976.1674668
  • Filename
    1674668