Title :
On Monte Carlo Testing of Logic Tree Networks
Author :
Agrawal, Pratfiima ; Agrawal, Vishwani D.
Author_Institution :
Department of Electrical Engineering, University of Southern California
fDate :
6/1/1976 12:00:00 AM
Abstract :
It is shown that by a proper selection of the probabilities of 0 and 1 at the inputs, the efficiency of random test generation can be improved. This correspondence includes some results describing the testing of actual logic networks used in a computer.
Keywords :
Combinational tree networks, detection probability, fault detection, logic testing, random test generation.; Circuit faults; Circuit testing; Computer networks; Contracts; Fault detection; Fluctuations; Logic testing; Monte Carlo methods; Probabilistic logic; Radar detection; Combinational tree networks, detection probability, fault detection, logic testing, random test generation.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1976.1674670
