• DocumentCode
    113299
  • Title

    Hydrogen in ZnO: X-ray absorption measurements and multiple scattering theory

  • Author

    Petravic, M. ; Peter, R. ; Varasanec, M. ; Yang, Y.-W. ; Yano, M. ; Koike, K.

  • Author_Institution
    Dept. of Phys. & Center for Micro & Nano Sci. & Technol., Univ. of Rijeka, Rijeka, Croatia
  • fYear
    2014
  • fDate
    14-17 Dec. 2014
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    We have identified the microscopic structure of hydrogen donors in hydrogenated ZnO samples using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and ab initio multiple scattering calculations. We present the evidence of hydrogen occupying interstitial bond-centred locations where hydrogen atoms are attached to the host O atoms in bonds that are not parallel to the c axis. This work illustrates that the combined NEXAFS measurements and multiple scattering calculations can be used to identify the local local structural configuration of hydrogen impurities in ZnO that should have broad applications for other hydrogen-containing systems.
  • Keywords
    EXAFS; II-VI semiconductors; hydrogen; hydrogenation; impurities; wide band gap semiconductors; zinc compounds; NEXAFS spectroscopy; ZnO:H; ab initio multiple scattering calculation; hydrogen donor; hydrogen impurities; hydrogenated ZnO materials; interstitial bond-centred location; local local structural configuration; microscopic structure; near-edge X-ray absorption fine structure; Absorption; Atomic measurements; Hydrogen; Impurities; Scattering; Spectroscopy; Zinc oxide; NEXAFS; hydrogen donors; multiple scattering theory; zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2014 Conference on
  • Conference_Location
    Perth, WA
  • Print_ISBN
    978-1-4799-6867-1
  • Type

    conf

  • DOI
    10.1109/COMMAD.2014.7038652
  • Filename
    7038652