DocumentCode
113299
Title
Hydrogen in ZnO: X-ray absorption measurements and multiple scattering theory
Author
Petravic, M. ; Peter, R. ; Varasanec, M. ; Yang, Y.-W. ; Yano, M. ; Koike, K.
Author_Institution
Dept. of Phys. & Center for Micro & Nano Sci. & Technol., Univ. of Rijeka, Rijeka, Croatia
fYear
2014
fDate
14-17 Dec. 2014
Firstpage
60
Lastpage
63
Abstract
We have identified the microscopic structure of hydrogen donors in hydrogenated ZnO samples using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and ab initio multiple scattering calculations. We present the evidence of hydrogen occupying interstitial bond-centred locations where hydrogen atoms are attached to the host O atoms in bonds that are not parallel to the c axis. This work illustrates that the combined NEXAFS measurements and multiple scattering calculations can be used to identify the local local structural configuration of hydrogen impurities in ZnO that should have broad applications for other hydrogen-containing systems.
Keywords
EXAFS; II-VI semiconductors; hydrogen; hydrogenation; impurities; wide band gap semiconductors; zinc compounds; NEXAFS spectroscopy; ZnO:H; ab initio multiple scattering calculation; hydrogen donor; hydrogen impurities; hydrogenated ZnO materials; interstitial bond-centred location; local local structural configuration; microscopic structure; near-edge X-ray absorption fine structure; Absorption; Atomic measurements; Hydrogen; Impurities; Scattering; Spectroscopy; Zinc oxide; NEXAFS; hydrogen donors; multiple scattering theory; zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2014 Conference on
Conference_Location
Perth, WA
Print_ISBN
978-1-4799-6867-1
Type
conf
DOI
10.1109/COMMAD.2014.7038652
Filename
7038652
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