On electron-beam Lorentz microscopy

A new analysis of the Lorentz deflection of an electron beam is presented which is particularly suitable for magnetic samples with open flux configurations. By using Amperian currents and Newton´s Third Law it is shown that the electron deflection problem can be solved very simply without extensive mathematics. As an example, a permanently magnetized thin film, which simulates a recorded digital “bit” is considered. The electron beam deflection equations found are closely related to Karlqvist´s well known forms for the fringing field above the gap of a writing head