DocumentCode :
1133138
Title :
The development of texture in Co-Cr films
Author :
Cheng-Zhang, Li ; Lodder, J.C. ; Szpunar, J.A.
Author_Institution :
Inst. of Comput. Technol., Acad. Sinica, Beijing, China
Volume :
30
Issue :
4
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
1373
Lastpage :
1379
Abstract :
Texture development as a function of film thickness (5-980 nm) was investigated for two series of Co81Cr19 films. In general, the films were strongly textured. The orientation ratio, ORc, was used to describe the strength of the texture. Experimental data showed that for the Series A films (5-200 nm), the OR c value increased with increasing him thickness, while for Series B films (46-980 nm), the ORc as a function of the film thickness described a single peak curve, with its maximum near 130 nm. The calculated local orientation ratios ORcx for both the Series A and B films had maxima near 110 nm. The strain in Co-Cr films also changes with the film thickness. In the case of the Series B films, the strain along the film normal gradually changed from a tensile to a compressive strain with increasing film thickness, and near 130 nm the film was in a stress-free condition. It was also discovered that for Co-Cr films thinner than 46 nm, the aspect ratio of the grains approaches 1 and the typical columnar structure of grains is not observed, although (0002) fibre texture still exists
Keywords :
chromium alloys; cobalt alloys; ferromagnetic properties of substances; magnetic thin films; texture; 46 to 980 nm; 5 to 200 nm; Co-Cr films; Co81Cr19; columnar structure; compressive strain; fibre texture; film thickness; grain aspect ratio; orientation ratio; tensile strain; texture; Capacitive sensors; Chromium; Crystal microstructure; Crystallization; Disk recording; Magnetic films; Magnetic properties; Perpendicular magnetic recording; Sputtering; Tensile strain;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.305535
Filename :
305535
Link To Document :
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