DocumentCode :
1133340
Title :
A fast locking and low jitter delay-locked loop using DHDL
Author :
Chang, Hsiang-Hui ; Lin, Jyh-Woei ; Liu, Shen-Iuan
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
38
Issue :
2
fYear :
2003
fDate :
2/1/2003 12:00:00 AM
Firstpage :
343
Lastpage :
346
Abstract :
A fast-locking and low-jitter delay-locked loop (DLL) using the digital-controlled half-replica delay line (DHDL) is presented. The DHDL can provide stable bias voltage for the charge-pump circuit to achieve low-jitter performances; meanwhile, the property of bandwidth tracking can still be preserved. It can also provide a larger pumping current to reduce the lock time in the initialization state and provide a smaller current to improve jitter performance in the locked state. For comparisons, both the proposed DLL and the self-biased DLL have been fabricated in a 0.35-μm one-poly four-metal CMOS process. From the measurement results, the proposed DLL has a shorter lock time and a better jitter performance than the self-biased DLL. The root-mean-squared jitter and peak-to-peak jitter are less than 4.2 and 30 ps, respectively, occurring at 75 MHz, over an operating frequency range of 50-150 MHz.
Keywords :
CMOS integrated circuits; delay lines; delay lock loops; jitter; mixed analogue-digital integrated circuits; 0.35 micron; 50 to 150 MHz; 75 MHz; ASIC; analog DLL; bandwidth tracking; charge-pump circuit; delay-locked loop; digital-controlled half-replica delay line; fast-locking DLL; initialization state; low-jitter DLL; one-poly four-metal CMOS process; stable bias voltage; Bandwidth; CMOS process; Charge pumps; Circuits; DH-HEMTs; Delay lines; Jitter; Performance evaluation; Time measurement; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2002.807399
Filename :
1175516
Link To Document :
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