DocumentCode :
113359
Title :
How InAs crystal phase affects the electrical performance of InAs nanowire FETs
Author :
Ullah, A.R. ; Joyce, H.J. ; Burke, A.M. ; Wong-Leung, J. ; Tan, H.H. ; Jagadish, C. ; Micolich, A.P.
Author_Institution :
Sch. of Phys., Univ. of New South Wales, Sydney, NSW, Australia
fYear :
2014
fDate :
14-17 Dec. 2014
Firstpage :
283
Lastpage :
285
Abstract :
We have studied the electronic transport characteristics of nanowire field effect transistors (NWFETs) made from phase-pure wurtzite (WZ) and zinc blende (ZB) InAs nanowires (NWs). The electronic characteristics were obtained at temperatures between 4 and 300 K. The ZB NWFETs exhibited a greater sensitivity to the surrounding atmosphere than WZ NWFETs. The WZ NWFETs had a higher mobility than ZB NWFETs at a given temperature. We also found that WZ NWs had a higher carrier density than ZB NWs at most temperatures, presumably due to differences in carbon incorporation during growth.
Keywords :
III-V semiconductors; carrier density; field effect transistors; indium compounds; nanowires; InAs; carrier density; crystal phase; electrical performance; nanowire FET; nanowire field effect transistors; phase pure wurtzite; sensitivity; temperature 4 K to 300 K; zinc blende nanowires; Crystals; Field effect transistors; Impurities; Nanoscale devices; Scattering; Temperature measurement; Zinc; InAs; nanowire FETs; wurtzite; zinc blende;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials & Devices (COMMAD), 2014 Conference on
Conference_Location :
Perth, WA
Print_ISBN :
978-1-4799-6867-1
Type :
conf
DOI :
10.1109/COMMAD.2014.7038712
Filename :
7038712
Link To Document :
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