Title :
An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories
Author :
Knaizuk, John, Jr. ; Hartmann, Carlos R P
Author_Institution :
Department of Computer Science, State University College
Abstract :
This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.
Keywords :
Fault detection stuck-at aults, optimal algorithm, random access memories.; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Fault detection; Hydrogen; Random access memory; Read-write memory; Registers; System testing; Fault detection stuck-at aults, optimal algorithm, random access memories.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1977.1674761
