Title :
Modeling and detection of high impedance faults
Author :
Huwei Wu ; Phung, B.T. ; Daming Zhang ; Jichao Chen
Author_Institution :
Sch. of Electr. Eng. & Telecommun., Univ. of New South Wales, Sydney, NSW, Australia
Abstract :
High Impedance Faults (HIF) on distribution feeders in a power system are abnormal electrical conditions that cannot be detected and cleared by conventional protection schemes due to its low fault current. In this paper, a detection scheme utilizing the distortion around zero-crossing as a distinguishing feature of HIF is proposed. Documented data from an 18-day program of ignition testing undertaken by HRL at the TCA High Energy Facility (NSW, Australia) has been analysed to determine the distinctive features of HIF. These key features are summarised as arcing phenomenon, randomness and intermittency, and harmonics and distortion. Using these features, a model has been developed and applied in ATP/EMTP (Alternative Transients Program / Electro-Magnetic Transients Program). Discrete Wavelet Transform (DWT) has been used to extract these identifiable characteristics, using the Modulus Maxima (MM) of wavelet transform to detect the distribution of distortion and discriminate HIF from other faults in the network. The use of this method has performed well within a simulated environment and with field test data and is worthy of further investigation.
Keywords :
EMTP; discrete wavelet transforms; fault diagnosis; power distribution faults; power distribution protection; ATP; Alternative Transients Program; DWT; EMTP; Electromagnetic Transients Program; HIF; HRL; TCA High Energy Facility; abnormal electrical conditions; arcing phenomenon; detection scheme; discrete wavelet transform; distortion around zero-crossing; distortion feature; distribution feeders; harmonic feature; high impedance faults detection; high impedance faults modeling; intermittency feature; modulus maxima; power system; randomness feature; Atmospheric modeling; Discrete wavelet transforms; Fault currents; Mathematical model; Wavelet analysis; ATP/EMTP; HIF; arc simulation; fault detection; wavelet transform;
Conference_Titel :
Smart Green Technology in Electrical and Information Systems (ICSGTEIS), 2014 International Conference on
Conference_Location :
Kuta
Print_ISBN :
978-1-4799-6126-9
DOI :
10.1109/ICSGTEIS.2014.7038738