• DocumentCode
    1133827
  • Title

    Bandwidth measurements of ultrahigh-frequency optical detectors using the interferometric FM sideband technique

  • Author

    Eichen, Elliot ; Silletti, Andrew

  • Author_Institution
    GTE Labs. Inc., Waltham, MA, USA
  • Volume
    5
  • Issue
    10
  • fYear
    1987
  • fDate
    10/1/1987 12:00:00 AM
  • Firstpage
    1377
  • Lastpage
    1381
  • Abstract
    A frequency modulated semiconductor laser and an interferometer are used as a source of very high frequency amplitude modulation to measure the response of optical detectors. This new technique does not require a laser with a flat, or even known, frequency response, and measures the detector response at frequencies well above the modulation frequency applied to the laser. The response of several InGaAs p-i-n detectors has been measured to 22 GHz using 1.3- and 1.55-μm semiconductor lasers modulated at only 500 MHz. These measurements were not limited by the measurement method, which may be capable of measuring bandwidths substantially in excess of 20 GHz.
  • Keywords
    FM; Optical interferometry; Optical receivers; Piezoelectric resonators; Amplitude modulation; Bandwidth; Frequency measurement; Frequency modulation; Frequency response; Indium gallium arsenide; Optical detectors; Optical interferometry; PIN photodiodes; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1987.1075442
  • Filename
    1075442