DocumentCode
1133827
Title
Bandwidth measurements of ultrahigh-frequency optical detectors using the interferometric FM sideband technique
Author
Eichen, Elliot ; Silletti, Andrew
Author_Institution
GTE Labs. Inc., Waltham, MA, USA
Volume
5
Issue
10
fYear
1987
fDate
10/1/1987 12:00:00 AM
Firstpage
1377
Lastpage
1381
Abstract
A frequency modulated semiconductor laser and an interferometer are used as a source of very high frequency amplitude modulation to measure the response of optical detectors. This new technique does not require a laser with a flat, or even known, frequency response, and measures the detector response at frequencies well above the modulation frequency applied to the laser. The response of several InGaAs p-i-n detectors has been measured to 22 GHz using 1.3- and 1.55-μm semiconductor lasers modulated at only 500 MHz. These measurements were not limited by the measurement method, which may be capable of measuring bandwidths substantially in excess of 20 GHz.
Keywords
FM; Optical interferometry; Optical receivers; Piezoelectric resonators; Amplitude modulation; Bandwidth; Frequency measurement; Frequency modulation; Frequency response; Indium gallium arsenide; Optical detectors; Optical interferometry; PIN photodiodes; Semiconductor lasers;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1987.1075442
Filename
1075442
Link To Document