DocumentCode :
1133945
Title :
Theory of instability-generated divergence of intense ion beams from applied-B ion diodes
Author :
Quintenz, Jeffrey P. ; Desjarlais, Michael P. ; Pointon, Timothy D. ; Slutz, Stephen A. ; Seidel, David B. ; Mehlhorn, Thomas A. ; Coats, Rebecca S. ; Kiefer, Mark L. ; Krall, Nicholas A. ; Bacon, Larry D.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Volume :
80
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
971
Lastpage :
984
Abstract :
Recent advances in the analytic theory and numerical simulation of applied-B ion diodes in general and, in particular, the diodes being tested experimentally on the Particle Beam Fusion Accelerator II at Sandia National Laboratories, Albuquerque, NM, are described. Numerical simulation of these diodes using the three-dimensional particle-in-cell code QUICKSILVER and analytic stability analysis have provided new insight into the physics governing instability-induced beam divergence. Experimental evidence of these instabilities is described and compared with the theory. When simulation parameters are chosen to model present experiments, QUICKSILVER calculates beam divergence near the measured value. A new understanding of the nature of the electromagnetic instabilities and their effects on beam divergence has led to suggestions for improved diode design. A simulation of one of these design concepts shows divergence levels in the vicinity of 10 mrad, a level considered adequate for ignition experiments
Keywords :
beam handling techniques; fusion reactor theory and design; ion beams; nuclear engineering computing; Particle Beam Fusion Accelerator II; QUICKSILVER; analytic stability analysis; applied-B ion diodes; electromagnetic instabilities; ignition experiments; inertial confinement fusion; instability-generated divergence; intense ion beams; numerical simulation; three-dimensional particle-in-cell code; Ion accelerators; Ion beams; Laboratories; Life estimation; Light emitting diodes; Numerical simulation; Particle accelerators; Particle beams; Stability analysis; Testing;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.149459
Filename :
149459
Link To Document :
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