DocumentCode
1134254
Title
Widely Tunable MEMS-Based Fabry–Perot Filter
Author
Milne, Jason S. ; Dell, John M. ; Keating, Adrian J. ; Faraone, Lorenzo
Author_Institution
Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Perth, WA, Australia
Volume
18
Issue
4
fYear
2009
Firstpage
905
Lastpage
913
Abstract
This paper describes the use of strain stiffening in fixed-fixed beam actuators to extend the tuning range of microelectromechanical-systems-based Fabry-Perot filters. The measured wavelength tuning range of 1.615-2.425 mum is the largest reported for such a filter. Curvature in the movable mirror was corrected using a low-power oxygen plasma to controllably alter the stress gradient in the mirror. After curvature correction, the linewidth of a filter was 52 nm, close to the theoretical minimum for our mirror design. As a proof of concept, a filter was bonded to a broadband infrared detector, realizing a wavelength-tunable infrared detector. All measured data have been compared to theoretical models of the optics and mechanics of the filters, with excellent agreement between theory and measurement demonstrated in all cases. Finally, the Young´s modulus and stress of the actuator materials were extracted directly from the measured voltage-displacement curves, demonstrating a novel technique for material property measurement.
Keywords
Young´s modulus; electro-optical filters; infrared detectors; micro-optomechanical devices; microactuators; micromirrors; optical design techniques; optical tuning; Fabry-Perot filter; Young´s modulus; broadband infrared detector; curvature correction; fixed-fixed beam actuators; low-power oxygen plasma; material property measurement; microelectromechanical system; movable mirror design; strain stiffening; stress gradient; voltage-displacement curves; wavelength 1.615 mum to 2.425 mum; wavelength-tunable infrared detector; widely tunable MEMS; Curvature correction; Fabry–Perot; MOEMS; Young´s modulus; doubly supported beam; fixed-fixed beam; infrared; material properties; microbridge; microelectromechanical systems (MEMS); optical filter; pull-in; short-wave infrared (SWIR); snap-down; stress; travel range; tuning range;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2009.2024793
Filename
5164984
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