DocumentCode :
1134513
Title :
Comparing the accuracy of critical-current measurements using the voltage-current simulator
Author :
Aized, D. ; Haddad, J.W. ; Joshi, C.H. ; Goodrich, L.F. ; Srivastava, A.N.
Author_Institution :
American Superconductor Corp., Westborough, MA, USA
Volume :
30
Issue :
4
fYear :
1994
fDate :
7/1/1994 12:00:00 AM
Firstpage :
2014
Lastpage :
2017
Abstract :
A passive voltage-current simulator developed by the National Institute of Standards and Technology (NIST) is used to compare the accuracy of critical current measurements and the power-law behavior of high temperature superconductors (HTS). In this study, critical current measurements made from four data acquisition and analysis systems are compared with those carried out at NIST. This paper also discusses various measurement techniques, methods of calculating critical current, and n-values. The V-I simulator is believed to be an advancement towards defining the standards for critical current measurements and ensuring the traceability of results at different test facilities
Keywords :
critical current density (superconductivity); electric current measurement; high-temperature superconductors; V-I simulator; critical-current measurements; high temperature superconductors; measurement techniques; n-values; power-law behavior; voltage-current simulator; Critical current; Current measurement; Data acquisition; Data analysis; High temperature superconductors; Measurement standards; Measurement techniques; NIST; Test facilities; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.305662
Filename :
305662
Link To Document :
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