Title :
A Note on Testing Logic Circuits by Transition Counting
Author :
Reddy, Sudhakar M.
Author_Institution :
Division of Information Engineering, University of Iowa
fDate :
3/1/1977 12:00:00 AM
Abstract :
Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.
Keywords :
Single and multiple faults, transition count testing.; Automata; Boolean functions; Circuit faults; Circuit testing; Logic circuits; Logic testing; Minimization; Polarization; Switching circuits; Taylor series; Single and multiple faults, transition count testing.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1977.1674831
