DocumentCode :
1135081
Title :
Wavelength dispersion of Ti induced refractive index change in LiNbO3as a function of diffusion parameters
Author :
Fouchet, S. ; Carenco, A. ; Daguet, C. ; Guglielmi, R. ; Riviere, L.
Author_Institution :
Centre National d́Etudes des Télécommunications, Laboratoire de Bagneux, Bagneux, France
Volume :
5
Issue :
5
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
700
Lastpage :
708
Abstract :
Z -cut X -propagating, LiNbO3:Ti planar waveguides have been characterized over a wide range of diffusion conditions. Measurements of Ti concentration and refractive indexes have revealed Gaussian profiles. Their dependence with diffusion conditions have been studied. The relation, established at several wavelengths ( \\lambda = 0.6328 \\mu m, 1.1523 μm, 1.523 μm), between extraordinary and ordinary refractive index change Del\\tan_{e,0}(z) and titanium concentration C(z) is found to be nonlinear and of the form: Del\\tan_{e,0}(z) = A_{e,0}(C_{0},\\lambda ) (C(z))^{\\alpha _{e,0}} While \\alpha _{e,0} is a constant, the proportionality coefficient A_{e,0} depends not only on the wavelength λ, but also on the diffusion conditions, characterized by C0, the Ti surface concentration of the diffused guide. Such a nonlinearity of Ti diffusion in LiNbO3has been revealed thanks to a complete and wide range investigation on both indiffused Ti and index profiles.
Keywords :
Infrared propagation in dispersive media; Optical planar waveguides; Optical refraction; Planar optical waveguide; Argon; Nonlinear optics; Optical films; Optical refraction; Optical surface waves; Optical variables control; Optical waveguides; Refractive index; Surface waves; Titanium;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1987.1075563
Filename :
1075563
Link To Document :
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