DocumentCode :
1135334
Title :
First Insight Into the Lifetime Acceleration Model of High- k \\hbox {ZrO}_{2}/\\hbox {SiO}_{2}/\\hbox {ZrO</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Author : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>Agaiby, Rimoon ; Hofmann, Peter ; Zhou, Dayu ; Kerber, Martin ; Heitmann, Johannes ; Schroeder, Uwe ; Erben, Eike ; Oberbeck, Lars</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Author_Institution : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>Qimonda Dresden GmbH, Dresden</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Volume : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>30</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Issue : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>4</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>fYear : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>2009</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>fDate : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>4/1/2009 12:00:00 AM</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Firstpage : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>340</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Lastpage : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>342</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Abstract : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>Long-term reliability results over six orders of magnitude in time are presented showing that the voltage acceleration model for ZrO<sub>2</sub>/SiO<sub>2</sub>/ZrO<sub>2</sub> exhibits an exponential dependence with voltage, down to 2 V. The voltage acceleration parameter gamma is between 10 and 15 V<sup>-1</sup>, depending on the biasing polarity. Soft-breakdown behavior (SILC) is evident prior to the onset of hard breakdown as a result of barrier lowering or charge accumulation in the high- <i>k</i> film. Under ac stress conditions, this SILC branch is lowered in magnitude, translating to a gain in lifetime to breakdown.</div>
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            <div class='leftDiv labelDiv col-xs-4 col-sm-2 fullRecLabelEnglish'>Keywords : </div><div class='valueDiv leftDirection leftAlign col-xs-8 col-sm-10 fullRecValueEnglish'>DRAM chips; reliability; silicon compounds; zirconium compounds; DRAM technology; SILC; ZrO<sub>2</sub>-SiO<sub>2</sub>-ZrO<sub>2</sub>; lifetime acceleration model; long-term reliability; soft-breakdown behavior; voltage acceleration model; <formula formulatype= $hbox{ZrO}_{2}$; Long-term TDDB; MIM capacitor;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2009.2012520
Filename :
4770147
Link To Document :
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