• DocumentCode
    1135433
  • Title

    Temperature as a limitation to the accuracy of SETSAW devices as quantum standards of current

  • Author

    Fletcher, N.E. ; Janssen, T.J.B.M. ; Hartland, A.

  • Author_Institution
    Nat. Phys. Lab., Teddington, UK
  • Volume
    149
  • Issue
    6
  • fYear
    2002
  • Firstpage
    299
  • Lastpage
    301
  • Abstract
    Measurements of the slopes (ΔI/ΔVg)n of the acoustoelectric current plateaux In=nef for n=1 and 2 have been made, as a function of the bath temperature T in the range 0.3 to 4.2 K. Electrons, constrained in one-dimensional channels, are transported by a surface acoustic wave of frequency f≈2.8 GHz, generated by transducers deposited on a GaAs heterostructure. The channel width is controlled by the application of voltages Vg to Schottky gates also deposited on the heterostructure. The normalised slopes S=(ΔI/ΔVg)n/(ΔI/ΔVg)n-1→n are compared with those calculated using a model describing the device behaviour proposed by Flensberg et al. (Phys. Rev. B, Condens. Matter, vol. 60, pp. R16291-4, 1999). In this model S is related to an effective temperature Teff, which can be greater than T. The measurements indicate that for n=1, Teff has a minimum value of 1.65±0.1 K corresponding to a minimum value of S≈10-3.
  • Keywords
    acoustic charge transport devices; active networks; constant current sources; measurement standards; single electron devices; surface acoustic wave devices; temperature; 0.3 to 4.2 K; 1.64 to 1.66 K; 1D channel constrained electrons; 2.8 GHz; Flensberg device behaviour model; GaAs; GaAs heterostructure; SAW frequency; SAW transducers; SETSAW quantum current standard device; Schottky gates; acoustoelectric current plateaux slope measurement; bath temperature range; effective temperature minimum value; normalised current plateaux slopes; single electron transport surface acoustic waves; surface acoustic wave electron transport; temperature accuracy limitation; voltage controlled channel width;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20020744
  • Filename
    1176533