• DocumentCode
    1135459
  • Title

    Maintenance and dissemination of voltage standards by Zener-diode-based instruments

  • Author

    Witt, T.J.

  • Author_Institution
    Bur. Int. des Poids et Mesures, Sevres, France
  • Volume
    149
  • Issue
    6
  • fYear
    2002
  • Firstpage
    305
  • Lastpage
    312
  • Abstract
    Although arrays of Josephson junctions are today´s primary reference standards of voltage, they are used by only 30 to 40 national metrology institutes around the world and perhaps a comparable number of primary metrology laboratories. Nearly all traceable voltage measurements are linked to Josephson standards by chains containing electronic DC voltage standards referenced to Zener diodes. These typically take the form of small, rather easily transportable instruments that provide outputs of 10 V and 1.018 V. The specified stability over a 1-year period of the 10 V outputs of the best Zener standards is quite good, of the order of one part in 106 of the nominal output voltage, and, by modelling temporal drift and correcting for environmental influences, output voltages can be predictable, over periods of several weeks or more, to within a few parts in 108. However, given that the demonstrated reproducibility of 10 V Josephson standards is of the order of a few parts in 1010 of the nominal output, an enormous increase in measurement uncertainty occurs in going from Josephson standards to Zeners. The various effects that limit the reproducibility of Zener standards, including drift, pressure, temperature and humidity effects and, ultimately, 1/f noise, are reviewed.
  • Keywords
    1/f noise; Zener diodes; circuit stability; humidity; measurement standards; measurement uncertainty; portable instruments; pressure; temperature; voltage measurement; 1 year; 1.018 V; 1/f noise; 10 V; Josephson junction arrays; Josephson standards; Zener diode electronic DC voltage standards; Zener-diode-based instruments; environmental influence correction; humidity effects; measurement uncertainty; national metrology institutes; nominal output voltage; pressure effects; primary metrology laboratories; primary voltage reference standards; specified output stability; standard reproducibility; standard voltage outputs; temperature effects; temporal drift modelling; traceable voltage measurements; transportable instruments;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20020640
  • Filename
    1176535