Title :
Reliability of nonhermetic bias-free LiNbO3 modulators
Author :
Nagata, Hirotoshi ; Li, Yagang ; Voisine, Kenneth R. ; Bosenberg, Walter R.
Author_Institution :
JDS Uniphase Corp., Bloomfield, CT, USA
Abstract :
Reliability for nonhermetic bias-free LiNbO3 optical modulators is estimated from aging data in both dry and damp heat conditions. The two dominant failure modes for these devices are: 1) device performance degradation due to temperature-activated drift of the annealed proton-exchange waveguide; and 2) optical insertion loss increase due to humidity-induced deterioration of glued fiber joints. A total failure rate of 30 failures in time (FITs) is predicted for 20 years operation at 45°C and moderate humidity conditions (40% RH). This estimate based on laboratory-test data is consistent with a field failure rate <5 FITs observed in fielded devices.
Keywords :
ageing; annealing; ion exchange; lithium compounds; optical losses; optical modulation; optical waveguides; reliability; thermal stability; 20 year; 45 degC; LiNbO3; LiNbO3 modulators; aging data; annealed proton-exchange waveguide; bias-free modulators; damp heat condition; device performance degradation; dry heat condition; failure modes; fielded devices; glued fiber joints; humidity conditions; humidity-induced deterioration; nonhermitic modulators; optical insertion loss; optical modulators; reliability; temperature-activated drift; thermal stability; Aging; Annealing; Degradation; Insertion loss; Optical devices; Optical fiber devices; Optical fiber losses; Optical modulation; Optical waveguides; Performance loss;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.834927
