Title :
DC-Voltage-induced thermal shift of bias point in LiNbO3 optical Modulators
Author :
Nagata, Hirotoshi ; O´Brien, N.F. ; Bosenberg, W.R. ; Reiff, G.L. ; Voisine, K.R.
Author_Institution :
JDS Uniphase Corp., Bloomfield, CT, USA
Abstract :
Increasing thermal shift of a bias point is observed when dc voltage is applied to z-cut LiNbO3 (LN) modulators having asymmetric design; whereas, stable thermal shift is observed in symmetric x-cut LN modulators. A growth of the thermal shift depends upon the amplitude, polarity, and duration of the applied voltage and constitutes a new criterion to reliability modeling of LN modulators.
Keywords :
electro-optical modulation; lithium compounds; optical materials; reliability; DC voltage; LiNbO3; LiNbO3 modulators; assymetric design; bias point; optical modulators; reliability modeling; symmetric modulators; thermal shift; z-cut LiNbO3; Conducting materials; Dielectric materials; Electrodes; Optical buffering; Optical design; Optical modulation; Phase modulation; Temperature; Testing; Voltage;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.834928
