Title :
Electroabsorption spectroscopy analysis of quantum-well modulator extinction and chirp
Author :
Kim, In ; Jang, Dong-Hoon
Author_Institution :
Telecommun. R&D Center, Samsung Electron. Co., Gyeonggi-Do, South Korea
Abstract :
Electroabsorption (EA) spectroscopy measurement on a planar wafer is used to estimate the extinction and chirp characteristics of the compressively strained quantum-well (QW) EA modulator. Whereas the Stark shift dominates the behavior of 90-Å well/75-Å barrier QW, 75-Å well/50-Å barrier structure features absorption edge broadening, and the chirp parameter decreases nonlinearly with bias. The EA spectroscopy results are compared with the characteristics of the modulator in the EA modulated laser.
Keywords :
Stark effect; chirp modulation; electro-optical modulation; electroabsorption; extinction coefficients; infrared spectra; semiconductor quantum wells; spectral line broadening; 50 angstrom; 75 angstrom; 90 angstrom; EA modulated laser; Stark shift; absorption edge broadening; barrier structure; compressively strained quantum-well; electroabsorption spectroscopy; modulator chirp; modulator extinction; planar wafer; quantum-well modulator; Absorption; Chirp modulation; Distributed feedback devices; Laser feedback; Optical modulation; Optical transmitters; Quantum well devices; Quantum well lasers; Quantum wells; Spectroscopy;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.835640
