Title :
Autotesting Speed-Independent Sequential Circuits
Author_Institution :
Istituto di Automatica, University of Rome
Abstract :
Speed-independent sequential circuits are characterized by an input-output behavior which is independent of the actual delays of the circuitry; this means that any unbounded delay is allowed in the component gates. This performance is accomplished by means of a control circuit which recognizes when the circuit is ready to accept a next input datum, and therefore a speed independent synthesis is realizable if and only if the input source can be controlled by the circuit itself.
Keywords :
Autotesting; fail safe; machine; modular; self-synchronizing; sequential network; speed-independent network; Electrons; Equations; Sequential circuits; Autotesting; fail safe; machine; modular; self-synchronizing; sequential network; speed-independent network;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1674959
