Title :
Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results
Author :
El-ziq, Yacoub M. ; Su, Stephen Y H
Author_Institution :
Design Automation and Test Department, Sperry Univac
Abstract :
Metal-oxide-semiconductor (MOS) logic elements offer advantages over bipolar logic elements, such as smaller size, complexity, and power consumption, as well as more flexibility and versatility. Since MOS is playing a major role in large-scale integration (LSI), synthesis of MOS networks with a large number of variables is very important.
Keywords :
Boolean functions; combinational logic; combinational networks; computer algorithm; diagnosable networks; easily testable networks; field-effect transistors; logic design automation; logic synthesis; metal-oxide semiconductor; statistical data; testability; Automatic testing; Computer networks; Costs; Design automation; Energy consumption; FETs; Large scale integration; Logic design; Logic testing; Network synthesis; Boolean functions; combinational logic; combinational networks; computer algorithm; diagnosable networks; easily testable networks; field-effect transistors; logic design automation; logic synthesis; metal-oxide semiconductor; statistical data; testability;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1674970
