DocumentCode
1136515
Title
High-Power Semiconductor-Based Nano and Subnanosecond Pulse Generator With a Low Delay Time
Author
Grekhov, Igor V. ; Korotkov, Sergey V. ; Stepaniants, Anatoly L. ; Khristyuk, Dmitry V. ; Voronkov, Vladimir B. ; Aristov, Yury V.
Author_Institution
Ioffe Inst. Russian Acad. of Sci., St. Petersburg, Russia
Volume
33
Issue
4
fYear
2005
Firstpage
1240
Lastpage
1244
Abstract
One of the promising designs of high-power nanosecond and subnanosecond pulse generators is based on the fast ionization dynistor (FID) stack triggered with nanosecond pulse of overvoltage. This pulse is usually formed by semiconductor opening switches. Delay time of these switches equals the sum of forward and reverse current pulse duration, i.e., several hundreds of nanoseconds. The novel opening switch, inverse recovery diode (IRD), is capable of forming a nanosecond pulse of voltage with the delay time equal to the reverse current pulse duration (15–20 ns) due to the special diode structure. High-voltage nanosecond pulse formed with IRD is used for fast triggering of the first FID from high-voltage dc-biased FID stack. The resulting fast overvoltage pulse is applied to the second FID, etc. As a result, the high-voltage FID-stack is switched for units of nanosecond. Total delay time of IRD-FID-based pulse generators is less than 30 ns.
Keywords
power semiconductor diodes; power semiconductor switches; pulse generators; pulsed power switches; trigger circuits; 15 to 20 ns; delay time; forward current pulse duration; inverse recovery diode; ionization dynistor; reverse current pulse duration; semiconductor opening switches; semiconductor-based pulse generator; triggering; Delay effects; Electrons; Impact ionization; Plasmas; Power semiconductor switches; Pulse generation; Pulse power systems; Semiconductor diodes; Silicon; Voltage control; Power semiconductor devices; pulse power system switches; pulse shaping methods; semiconductor diode switches;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2005.852349
Filename
1495564
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