DocumentCode
1136608
Title
Influence of the Lifetime of the Laser-Excited Level and the Laser Pulse Duration on the Saturated LIF Signal During the Prebreakdown Phases of a Pseudospark Discharge
Author
Arsov, Vladimir ; Frank, Klaus
Author_Institution
Phys. Dept., Univ. of Erlangen-Nuremberg, Erlangen, Germany
Volume
33
Issue
4
fYear
2005
Firstpage
1294
Lastpage
1306
Abstract
Ground state copper vapor number density, sputtered from the cathode of an experimental pseudospark switch is measured using laser-induced fluorescence (LIF) from the copper transition
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at 510.55 nm. Measurements are made in the hollow cathode at several axial positions in the time interval between the trigger pulse and the voltage breakdown. At voltage 1 kV, this interval, referred to as a prebreakdown phase, has a random and variable shot to shot duration, but discharges for which this duration is the same reveal similar properties and can be arranged in groups. The presented results are for prebreakdown duration of 1
s. The metal vapor density is determined from the LIF signal by using both its maximum and integral. This approach follows from a widely used LIF model, which is examined in detail to reveal a less familiar feature, namely the possibility to obtain an estimate of the lifetime of the laser-excited level, which has been considered perturbed by collisions during the discharge. A comparison between this estimate and the lifetime, obtained by the exponential decay of the LIF signal, reveals good agreement.
-
at 510.55 nm. Measurements are made in the hollow cathode at several axial positions in the time interval between the trigger pulse and the voltage breakdown. At voltage 1 kV, this interval, referred to as a prebreakdown phase, has a random and variable shot to shot duration, but discharges for which this duration is the same reveal similar properties and can be arranged in groups. The presented results are for prebreakdown duration of 1
s. The metal vapor density is determined from the LIF signal by using both its maximum and integral. This approach follows from a widely used LIF model, which is examined in detail to reveal a less familiar feature, namely the possibility to obtain an estimate of the lifetime of the laser-excited level, which has been considered perturbed by collisions during the discharge. A comparison between this estimate and the lifetime, obtained by the exponential decay of the LIF signal, reveals good agreement.Keywords
copper; glow discharges; plasma collision processes; plasma density; plasma diagnostics; plasma switches; sparks; 1 kV; 1 mus; 510.55 nm; Cu; copper transition; exponential decay; ground state copper vapor number density; hollow cathode; laser pulse duration; laser-excited level lifetime; laser-induced fluorescence; prebreakdown phases; pseudospark discharge; pseudospark switch; trigger pulse; voltage breakdown; Cathodes; Copper; Density measurement; Laser transitions; Life estimation; Lifetime estimation; Optical pulses; Pulse measurements; Stationary state; Switches; Density measurement; laser-induced fluorescence; optical saturation; pseudospark;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2005.852351
Filename
1495572
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