DocumentCode
1136702
Title
Laterally intermixed quantum structure for carrier confinement in vertical-cavity surface-emitting lasers
Author
Sugawara, Yoko ; Miyamoto, Takahiro
Author_Institution
Precision & Intell. Lab., Tokyo Inst. of Technol., Yokohama
Volume
45
Issue
3
fYear
2009
Firstpage
167
Lastpage
168
Abstract
A quantum structure intermixing from the lateral direction of the mesa sidewall is proposed as an improvement method of the performance of vertical-cavity surface-emitting lasers (VCSELs). Threshold current reduction of 70%, a differential quantum efficiency increase of 75% and a two times increase in output power were achieved by suppression of the surface recombination current and by the carrier confinement in the post-type VCSEL.
Keywords
carrier lifetime; surface emitting lasers; surface recombination; VCSEL; carrier confinement; carrier diffusion; differential quantum efficiency; quantum structure intermixing; surface recombination current; threshold current; vertical-cavity surface-emitting lasers;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20093587
Filename
4770460
Link To Document