DocumentCode :
1136702
Title :
Laterally intermixed quantum structure for carrier confinement in vertical-cavity surface-emitting lasers
Author :
Sugawara, Yoko ; Miyamoto, Takahiro
Author_Institution :
Precision & Intell. Lab., Tokyo Inst. of Technol., Yokohama
Volume :
45
Issue :
3
fYear :
2009
Firstpage :
167
Lastpage :
168
Abstract :
A quantum structure intermixing from the lateral direction of the mesa sidewall is proposed as an improvement method of the performance of vertical-cavity surface-emitting lasers (VCSELs). Threshold current reduction of 70%, a differential quantum efficiency increase of 75% and a two times increase in output power were achieved by suppression of the surface recombination current and by the carrier confinement in the post-type VCSEL.
Keywords :
carrier lifetime; surface emitting lasers; surface recombination; VCSEL; carrier confinement; carrier diffusion; differential quantum efficiency; quantum structure intermixing; surface recombination current; threshold current; vertical-cavity surface-emitting lasers;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20093587
Filename :
4770460
Link To Document :
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