Title :
Simulation study of stochastic dark line features in correlated K-distributed images
Author :
Fukuda, Seisuke ; Nakaichi, Yuhei ; Hirosawa, Haruto
Author_Institution :
Inst. of Space & Astronaut. Sci., Japan Aerosp. Exploration Agency, Sagamihara, Japan
Abstract :
Intensity fluctuation of synthetic aperture radar (SAR) images, due to speckle and texture, statistically brings series connections of dark pixels. Resolution enhancement of SAR systems can provide texture with correlation properties. In this paper, simulation studies are carried out to investigate the relation between the occurrence of the stochastic dark line features and texture correlation.
Keywords :
correlation methods; feature extraction; geophysical signal processing; image resolution; image texture; radar resolution; remote sensing by radar; speckle; stochastic processes; synthetic aperture radar; SAR images; SAR systems; correlated K-distributed images; image texture; intensity fluctuation; resolution enhancement; speckle; stochastic dark line features; synthetic aperture radar; texture correlation; Fluctuations; Layout; Pixel; Radar imaging; Rivers; Roads; Spatial resolution; Speckle; Stochastic processes; Synthetic aperture radar; Correlated texture; K-distribution; speckle; stochastic line feature;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2004.835297
