• DocumentCode
    1136888
  • Title

    Comments on "Procedures for Eliminating Static and Dynamic Hazards in Test Generation"

  • Author

    Hlawiczka, Andrzej

  • Author_Institution
    Instytut Maszyn Matematycznych
  • Issue
    2
  • fYear
    1978
  • Firstpage
    191
  • Lastpage
    191
  • Abstract
    The following comments on the paper1by M. A. Breuer may be in order.
  • Keywords
    Circuit testing; Delay; Hafnium; Hazards; Information processing; Logic; Reflective binary codes; Sequential analysis; Sequential circuits; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1978.1675064
  • Filename
    1675064
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1136888