Title :
A Quantitative Study of the Orientation Bias of Some Edge Detector Schemes
Author :
Deutsch, Edward S. ; Fram, Jerry R.
Author_Institution :
State Electric Co. Ltd.
fDate :
3/1/1978 12:00:00 AM
Abstract :
Further work on the evaluation of a particular set of edge detection schemes is described. The orientational bias of these schemes is addressed in particular. Improved qualitative observations are reported and a comparison of the evaluation method discussed here with another edge detection evaluation method is presented.
Keywords :
Edge detection schemes; image processing; quantitative evaluation; Detectors; Ferroelectric films; Image edge detection; Image processing; Image segmentation; Noise generators; Nonvolatile memory; Random access memory; Signal to noise ratio; Testing; Edge detection schemes; image processing; quantitative evaluation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675073
