Title :
On the Detection of Terminal Stuck-Faults
Author :
Kuhl, J.G. ; Reddy, S.M.
Author_Institution :
Division of Information Engineering, University of Iowa
fDate :
5/1/1978 12:00:00 AM
Abstract :
Two lower bounds on the length of terminal stuck-fault tests and a technique to facilitate detection of terminal stuck-faults are given.
Keywords :
Lower bounds; stuck-at-faults; terminal stuck-faults; Notice of Violation; Pattern matching; Pattern recognition; Shape; Tin; Yttrium; Lower bounds; stuck-at-faults; terminal stuck-faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1978.1675129
